Modeling of Electronic Transport through Metal/Polymer Interfaces in Thin Film Transistors

Table 1

The extracted value of the barrier activation voltage (~barrier height) for the source and drain electrodes is given, for the set of contact material studied in this work.

Electrode material	Φ𝑠 (eV)	Φ𝑑 (eV)
Au	0.84	0.68
CoFe/Al/Al2O3	0.84	0.85
CoFe/Al2O3 (as deposited)	0.79	0.66
CoFe/Al2O3 (natural oxidation)	0.73	0.58
NiFe	0.47	0.49
CoFe	0.70	0.80