Table of Contents
ISRN Agronomy
Volume 2013, Article ID 738379, 8 pages
Review Article

Resistance to Phomopsis Seed Decay in Soybean

1United States Department of Agriculture-Agricultural Research Service, Crop Genetics Research Unit, Stoneville, MS 38776, USA
2University of Arkansas, Fayetteville, AR 72701, USA

Received 22 November 2012; Accepted 10 December 2012

Academic Editors: J. A. Casaretto, E. Perez-Artes, and J. Ransom

Copyright © 2013 Shuxian Li and Pengyin Chen. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Shuxian Li and Pengyin Chen, “Resistance to Phomopsis Seed Decay in Soybean,” ISRN Agronomy, vol. 2013, Article ID 738379, 8 pages, 2013.