Table of Contents
ISRN Nanotechnology
Volume 2013, Article ID 893060, 21 pages
Review Article

In Situ Real-Time TEM Reveals Growth, Transformation and Function in One-Dimensional Nanoscale Materials: From a Nanotechnology Perspective

Electron Microscopy and Analysis Facility, Materials Chemistry and Analysis Group, Tyndall National Institute, Cork, Ireland

Received 14 November 2012; Accepted 28 November 2012

Academic Editors: E. Cattaruzza, C.-L. Hsu, and W. Lu

Copyright © 2013 Nikolay Petkov. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


This paper summarises recent developments in in situ TEM instrumentation and operation conditions. The focus of the discussion is on demonstrating how improved understanding of fundamental physical phenomena associated with nanowire or nanotube materials, revealed by following transformations in real time and high resolution, can assist the engineering of emerging electronic and optoelectronic devices. Special attention is given to Si, Ge, and compound semiconductor nanowires and carbon nanotubes (CNTs) as one of the most promising building blocks for devices inspired by nanotechnology.