Table of Contents
ISRN Optics
Volume 2014 (2014), Article ID 684317, 7 pages
http://dx.doi.org/10.1155/2014/684317
Research Article

Characterization of Silver Oxide Films Formed by Reactive RF Sputtering at Different Substrate Temperatures

1Department of Physics, Sri Venkateswara University, Tirupati-517 502, India
2Department CP2S, Institut Jean Lamour (UMR CNRS 7198), University of Lorraine, 54011 Nancy Cedex, France

Received 8 December 2013; Accepted 11 February 2014; Published 18 March 2014

Academic Editors: A. Baryshev and Y. S. Kivshar

Copyright © 2014 P. Narayana Reddy et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

P. Narayana Reddy, M. Hari Prasad Reddy, J. F. Pierson, and S. Uthanna, “Characterization of Silver Oxide Films Formed by Reactive RF Sputtering at Different Substrate Temperatures,” ISRN Optics, vol. 2014, Article ID 684317, 7 pages, 2014. doi:10.1155/2014/684317