Journals
Publish with us
Publishing partnerships
About us
Blog
International Scholarly Research Notices
Table of Contents
International Scholarly Research Notices
/
2014
/
Article
/
Fig 4
/
Research Article
Characterization of Silver Oxide Films Formed by Reactive RF Sputtering at Different Substrate Temperatures
Figure 4
XPS survey scan of silver oxide films formed at substrate temperature of 303 K and 473 K.