Research Article

Effect of Growth Temperature on Structural Quality of In-Rich Alloys on Si (111) Substrate by RF-MOMBE

Figure 4

(a) Cross-sectional bright field TEM image, (b) the corresponding SAD pattern, (c) HRTEM image, and (d) STEM-HAADF image from /Si (111).
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(a)
980206.fig.004b
(b)
980206.fig.004c
(c)
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(d)