Table of Contents
International Scholarly Research Notices
Volume 2015 (2015), Article ID 657254, 9 pages
http://dx.doi.org/10.1155/2015/657254
Research Article

Effects of Curved Wavefronts on Conductor-Backed Reflection-Only Free-Space Material Characterization Techniques

1Loyola University Maryland, Baltimore, MD 21210, USA
2Michigan State University, East Lansing, MI 48824, USA

Received 8 March 2015; Accepted 6 July 2015

Academic Editor: Vincent Ji

Copyright © 2015 Raenita A. Fenner and Edward J. Rothwell. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

A true plane wave is often not physically realizable in a laboratory environment. Therefore, wavefront curvature introduces a form of systematic error into Free-space material characterization methods. Free-space material characterization is important to the determination of the electric permittivity and magnetic permeability of conductor-backed and in situ materials. This paper performs an error analysis of the impact on wavefront curvature on a Free-space method called the two-thickness method. This paper compares the extracted electric and magnetic permeability computed with a plane wave versus a line source for a low-loss dielectric and magnetic radar absorbing material. These steps are conducted for TE and TM plane waves and electric and magnetic line sources.