Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity

<table>Measured SXRR profiles of BN thin film at selected energies near boron K-edge. The inset shows optical constants of B<sub>2</sub>O<sub>3</sub> (calculated) and BN (measured) near edge to compare the effect of optical constants on reflectivity pattern. The arrows in inset indicate the small energy range over which the measured reflectivity pattern shown.</table>

Journal of Atomic and Molecular Physics

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Figure 20

Figure 20: Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity 

Figure 20 | Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity 