Approach to the Highest HXR Yield in Plasma Focus Device Using Adaptive Neurofuzzy Inference System to Optimize Anode Configuration

Table 2

The comparison between experimental and interpreted results for testing data.

Voltage	Pressure	Φ1	Φ2	Experimental	Hard X-ray (V·s × 10^−7)
					SD	ANFIS
11	2.5	90	90	−0.104	0.01	−0.11022
11	4	90	90	−1.562	0.21	−1.56031
11	6.5	90	90	−0.212	0.08	−0.21855
12	3	90	90	−0.098	0.01	−0.09225
12	7	90	90	−0.126	0.06	−0.12429
13	4	90	90	−0.352	0.106	−0.33832
13	5.5	90	90	−1.44	0.167	−1.51299
11	2	90	84.28	−0.108	0.026	−0.10941
11	4	90	84.28	−1.124	0.063	−1.12227
11	5	90	84.28	−2.141	0.218	−2.14826
12	3	90	84.28	−0.187	0.063	−0.17701
12	4.5	90	84.28	−1.743	0.191	−1.742
13	3.5	90	84.28	−0.535	0.196	−0.53538
13	6	90	84.28	−2.67	0.158	−2.67017
11	2.5	79.7	79.7	−0.114	0.017	−0.11976
11	4.5	79.7	79.7	−2.57	0.183	−2.56853
11	5.5	79.7	79.7	−2.09	0.091	−2.14214
12	3.5	79.7	79.7	−1.98	0.0416	−1.94411
12	5.5	79.7	79.7	−2.34	0.0231	−2.36587
12	6	79.7	79.7	−2.22	0.02	−2.08493
13	3.5	79.7	79.7	−2.56	0.116	−2.54087
13	5	79.7	79.7	−2.98	0.0354	−2.97635
13	6	79.7	79.7	−2.13	0.0495	−2.13296

SD stands for standard deviation for each experimental measurement.