Approach to the Highest HXR Yield in Plasma Focus Device Using Adaptive Neurofuzzy Inference System to Optimize Anode Configuration

Table 3

Obtained errors for training and testing results of the ANFIS.

Error	Data
	Train	Test
MRE %	1.12	2.18
MAE	0.013	0.017
RMSE	0.020	0.035
CF	0.99972	0.99938