Table of Contents
Journal of Experimental Physics
Volume 2014, Article ID 569691, 5 pages
http://dx.doi.org/10.1155/2014/569691
Research Article

Thickness and Interface-Dependent Structural, Magnetic, and Transport Properties of Cu/Co Thin Film and Multilayer Structures

Department of Physics, Amity University, Gurgaon, Haryana 122413, India

Received 27 May 2014; Revised 2 August 2014; Accepted 3 August 2014; Published 19 August 2014

Academic Editor: Robert Sang

Copyright © 2014 R. Brajpuriya. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Structural, magnetic, and transport properties of electron beam evaporated Co/Cu thin films and multilayer structures (MLS) having different layer thicknesses have been characterized utilizing X-ray diffraction (XRD), magnetooptical Kerr effect (MOKE), and resistivity techniques. The structural studies show distinctive crystal structures for different sublayer thicknesses. The Co (300 Å) single layer film is amorphous, while Cu (300 Å) film is nanocrystalline in nature. The average particle size is found to decrease as the number of interface increases. The corresponding magnetic and resistivity measurements show an increase in saturation field and resistivity as a result of an enhanced anisotropy. However, coercivity decreases with a reduction in average particle size. The results conclude that these properties are greatly influenced by various microstructural parameters such as layer thickness, number of bilayers, and the quality of interfaces molded under different growth conditions.