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Journal of Materials
Volume 2015 (2015), Article ID 215210, 8 pages
http://dx.doi.org/10.1155/2015/215210
Research Article

Rutherford Backscattering Spectrometry Analysis and Structural Properties of Thin Films Deposited by Chemical Spray Pyrolysis

1Engineering Materials Development Institute, Akure 340223, Nigeria
2Center for Energy Research and Development, Obafemi Awolowo University, Ile-Ife 220005, Nigeria
3Department of Physics and Engineering Physics, Obafemi Awolowo University, Ile-Ife 220005, Nigeria

Received 8 June 2015; Revised 11 August 2015; Accepted 11 August 2015

Academic Editor: Rodrigo Martins

Copyright © 2015 Abiodun E. Adeoye et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Abiodun E. Adeoye, Emmanuel Ajenifuja, Bidini A. Taleatu, and A. Y. Fasasi, “Rutherford Backscattering Spectrometry Analysis and Structural Properties of Thin Films Deposited by Chemical Spray Pyrolysis,” Journal of Materials, vol. 2015, Article ID 215210, 8 pages, 2015. doi:10.1155/2015/215210