Journal of Materials / 2015 / Article / Fig 3

Research Article

Rutherford Backscattering Spectrometry Analysis and Structural Properties of Thin Films Deposited by Chemical Spray Pyrolysis

Figure 3

SEM micrographs of deposited thin film of for (a) ZPS1, (b) ZPS2, (c) ZPS3, (d) ZPS4, (e) ZPS5, and (f) ZPS6.
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