Journal of Materials / 2015 / Article / Tab 1

Research Article

Rutherford Backscattering Spectrometry Analysis and Structural Properties of Thin Films Deposited by Chemical Spray Pyrolysis

Table 1

Summary of deposition precursor.

SamplePrecursors (concentration, volume)

ZPS1Zn(CH3COO)2 2H2O (0.1 M, 0 mL) + Pb(CH3COO)2⋅3 H2O (0.1 M, 10 mL) + CS(NH2)2 (0.1 M, 20 mL)
ZPS2Zn(CH3COO)2 2H2O (0.1 M, 0.2 mL) + Pb(CH3COO)2⋅3 H2O (0.1 M, 9.80 mL) + CS(NH2)2 (0.1 M, 20 mL)
ZPS3Zn(CH3COO)2 2H2O (0.1 M, 0.4 mL) + Pb(CH3COO)2⋅3 H2O (0.1 M, 9.60 mL) + CS(NH2)2 (0.1 M, 20 mL)
ZPS4Zn(CH3COO)2 2H2O (0.1 M, 0.6 mL) + Pb(CH3COO)2⋅3 H2O (0.1 M, 9.40 mL) + CS(NH2)2 (0.1 M, 20 mL)
ZPS5Zn(CH3COO)2 2H2O (0.1 M, 0.8 mL) + Pb(CH3COO)2⋅3 H2O (0.1 M, 9.20 mL) + CS(NH2)2 (0.1 M, 20 mL)
ZPS6Zn(CH3COO)2 2H2O (0.1 M, 1.0 mL) + Pb(CH3COO)2⋅3 H2O (0.1 M, 9.0 mL) + CS(NH2)2 (0.1 M, 20 mL)