Journal of Materials / 2015 / Article / Tab 2

Research Article

Rutherford Backscattering Spectrometry Analysis and Structural Properties of Thin Films Deposited by Chemical Spray Pyrolysis

Table 2

Elemental compositions and thickness profiles of thin films.

Sample codeCompositions (%)RBS thickness (1015 atoms/cm)Linear thickness (nm)
ZnPbS

ZPS140.5859.42155.22081
ZPS21.6547.3750.98156.14782
ZPS33.1545.8351.02156.12182
ZPS44.8444.5750.59156.31882
ZPS57.4542.3050.25157.45282
ZPS68.8440.8250.34172.46590