Journal of Materials / 2015 / Article / Tab 3

Research Article

Rutherford Backscattering Spectrometry Analysis and Structural Properties of Thin Films Deposited by Chemical Spray Pyrolysis

Table 3

ratio of prominent peaks of the prepared films and that of the JCPDS standard.

Relative intensity ratioJCPDS standardZPS1ZPS2ZPS3ZPS4ZPS5ZPS6

0.840.140.150.220.240.240.24
0.570.120.140.170.210.220.22