Research Article
Investigating Phase Transform Behavior in Indium Selenide Based RAM and Its Validation as a Memory Element
Table 2
Characteristics properties of Indium Selenide based PCRAM.
| Parameter | Symbol | Numeric data |
| Threshold voltage | | 0.78 V | Holding voltage | | 0.45 V | Melting point of In2Se3 | | 600°C | Glass transition point (In2Se3) | | 373°C | Crystalline state resistance (static resistance of set) | | 103 Ω | Amorphous state resistance (static resistance of reset) | | 630 kΩ | Dynamic on-resistance | | 1 kΩ | Thermal conductivity of In2Se3 | | 37 W cm−1K−1 (parallel) 120 W cm−1K−1 (perpendicular) | Thermal capacity of In2Se3 | | 1.25 Jcm−3K−1 | Activation energy of In2Se3 | | 0.17 eV | Boltzmann constant | | J/K | Volume of PCM cell | | cm3 | Reset current | | 11.7 µA | Set current | | 208 µA | Reset pulse width | | 20 ns | Set pulse width | | 100 µs | Read current | | 5 µA | Read pulse width | | 25 ns | Resistance switching ratio | RSR | | Electrical resistivity | | 6.7 ohm-cm | Specific heat | | 0.27 Jcm−3K−1 | Reset power | | 80 µW | Set power | | 0.25 nW | Reset energy | | 1.6 PJ | Set energy | | 25 Fj | Crystallization temp | | 477°C |
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