Table of Contents
Journal of Nanoparticles
Volume 2013, Article ID 640436, 11 pages
Review Article

Small Angle X-Ray Scattering Technique for the Particle Size Distribution of Nonporous Nanoparticles

1Department of Industrial and Manufacturing Engineering, Florida State University, 2525 Pottsdamer Street, Tallahassee, FL 32310, USA
2North Carolina State University, Department of Mechanical & Aerospace Engineering, 911 Oval Drive, Raleigh, NC 27695, USA

Received 22 July 2013; Revised 19 November 2013; Accepted 20 November 2013

Academic Editor: Frank Hubenthal

Copyright © 2013 A. Agbabiaka et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Nanoparticles are small particles whose sizes are less than 100 nm. They have many industrial applications due to their unique properties. Their properties are often size-dependent; thus the accurate determination of nanoparticle sizes is important for quality assurance of nanoparticle production processes. A small angle X-ray scattering technique is a promising method used for characterizing nanoparticle sizes. It has distinctive advantages over other techniques such as electron microscope techniques. In this paper, we review the state-of-the-art methods for determining the sizes of nanoparticles with small angle X-ray experiments and discuss the advantages and limitations of the state-of-the-art methods.