Table of Contents
International Journal of Quality, Statistics, and Reliability
Volume 2008 (2008), Article ID 594753, 10 pages
http://dx.doi.org/10.1155/2008/594753
Research Article

A Unified Approach for Predicting Long- and Short-Term Capability Indices with Dependence on Manufacturing Target Bias

Department of Electrical Engineering, The University of Texas at Tyler, Tyler, TX 75799, USA

Received 15 April 2008; Revised 25 September 2008; Accepted 14 December 2008

Academic Editor: Satish Bukkapatnam

Copyright © 2008 Nikhil T. Satyala and R. J. Pieper. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Nikhil T. Satyala and R. J. Pieper, “A Unified Approach for Predicting Long- and Short-Term Capability Indices with Dependence on Manufacturing Target Bias,” International Journal of Quality, Statistics, and Reliability, vol. 2008, Article ID 594753, 10 pages, 2008. doi:10.1155/2008/594753