Table of Contents
International Journal of Quality, Statistics, and Reliability
Volume 2008, Article ID 594753, 10 pages
http://dx.doi.org/10.1155/2008/594753
Research Article

A Unified Approach for Predicting Long- and Short-Term Capability Indices with Dependence on Manufacturing Target Bias

Department of Electrical Engineering, The University of Texas at Tyler, Tyler, TX 75799, USA

Received 15 April 2008; Revised 25 September 2008; Accepted 14 December 2008

Academic Editor: Satish Bukkapatnam

Copyright © 2008 Nikhil T. Satyala and R. J. Pieper. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Linked References

  1. G. Taguchi and Y. Wu, Introduction to Off-Line Quality Control, Central Japan Quality Control Association, Nagoya, Japan, 1979.
  2. E. E. Lewis, Introduction to Reliability Engineering, John Wiley & Sons, New York, NY, USA, 2nd edition, 1996.
  3. S. Kotz, W. L. Pearn, and N. L. Johnson, “Some process capability indices are more reliable than one might think,” Applied Statistics, vol. 42, no. 1, pp. 55–62, 1993. View at Publisher · View at Google Scholar
  4. E. Kureková, “Measurement process capability—trends and approaches,” Measurement Science Review, vol. 1, no. 1, pp. 43–46, 2001. View at Google Scholar
  5. R. A. Boyles, “Process capability with asymmetric tolerances,” Communications in Statistics—Simulation and Computation, vol. 23, no. 3, pp. 615–635, 1994. View at Publisher · View at Google Scholar
  6. J. P. Chen and C. G. Ding, “A new process capability index for non-normal distributions,” Journal of Quality and Reliability Management, vol. 18, no. 6-7, 762 pages, 2001. View at Google Scholar
  7. L. K. Chan, S. W. Cheng, and F. A. Spring, “A new measure of process capability Cpm,” Journal of Quality Technology, vol. 20, pp. 162–175, 1998. View at Google Scholar
  8. “A guide to Using Cpk,” The Association for Manufacturing Technology (AMT), 2002, http://www.amtonline.org/document_display.cfm/document_id/133/section_id/57/gui detousingcpk–aprocesscapabilityindex.
  9. S. Winitzki, “A handy approximation for the error function and its inverse,” A lecture note obtained through private communication.
  10. S. Winitzki, “Uniform approximations for transcendental functions,” in Proceedings of the International Conference on Computational Science and Its Applications (ICCSA '03), vol. 2667 of Lecture Notes in Computer Science, pp. 780–789, Montreal, Canada, May 2003.
  11. R. J. Pieper and N. T. Satyala, “An improved characterization for predicting a capability index with dependence on manufacturing target bias,” in Proceedings of the 40th Annual Southeastern Symposium on System Theory (SSST '08), pp. 113–117, New Orleans, La, USA, March 2008. View at Publisher · View at Google Scholar
  12. “MATLAB Software,” The Math Works Inc., www.mathworks.com.
  13. M. L. Harry and J. R. Lawson, Six Sigma Productivity Analysis and Process Characterization, Motorola/Addison Wesley, Reading, Mass, USA, 1992.
  14. M. R. Spiegel and J. Liu, Mathematical Handbook of Formulas and Tables, Schaum's Outline Series, McGraw Hill, New York, NY, USA, 2nd edition, 1999.