Table of Contents
International Journal of Quality, Statistics, and Reliability
Volume 2011 (2011), Article ID 396297, 8 pages
http://dx.doi.org/10.1155/2011/396297
Research Article

Quality Assessment of Transient Response Analysis Method for Detecting Radiation-Induced Faults

1Mechatronics Research Group, Universidad Tecnológica Nacional, Avenida Universidad 450, 5900 Villa María, Argentina
2Electronics and Instrumentation Development Group, Universidad Nacional de Córdoba, Medina Allende S/N, 5000 Córdoba, Argentina

Received 17 January 2011; Revised 12 June 2011; Accepted 23 June 2011

Academic Editor: Suk joo Bae

Copyright © 2011 José Peralta et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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