Table of Contents
Journal of Quality and Reliability Engineering
Volume 2014, Article ID 564049, 13 pages
Research Article

Optimum Time-Censored Constant-Stress PALTSP for the Burr Type XII Distribution Using Tampered Failure Rate Model

Department of Operational Research, University of Delhi, Delhi 110007, India

Received 31 October 2013; Revised 11 April 2014; Accepted 11 April 2014; Published 18 June 2014

Academic Editor: Shey-Huei Sheu

Copyright © 2014 P. W. Srivastava and D. Sharma. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


This paper presents optimum design of time-censored constant-stress partially accelerated life test sampling plan (PALTSP) in which each item runs either at use or at accelerated conditions and product life follows Burr type XII. The optimal plan consists in finding out sample proportions allocated to both use and accelerated conditions by minimizing the asymptotic variance of test statistic for deciding on acceptance/rejection of the lot such that producer’s and consumer’s interests are safeguarded. The method developed has been illustrated using an example. Sensitivity analysis has also been carried out.