Table of Contents
Laser Chemistry
Volume 16, Issue 1, Pages 5-18

Ionic Fragmentation of NO Following Excitation of the NK-Shell and the OK-Shell Electron

Electrotechnical Laboratory, Umezono, Tsukuba-shi, Ibaraki 305, Japan

Received 21 May 1994

Copyright © 1995 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Ionic fragmentation of NO stimulated by soft X-ray absorption has been studied using a monochromatized synchrotron radiation and a time-of-flight mass spectrometer. In photoexcitation of a 1s electron, the singly charged molecular ion NO+ was formed only at 410 and 533 eV (transitions to the 2π orbital), and a fragment ion N+ had the highest intensity in all the energies. The doubly charged molecular ion was produced appreciably, and fragment ions (N2+ and O2+) were formed considerably even below the 1s ionization thresholds. The measured time-of-flight spectra were converted into kinetic energy distributions of N+, O+, N2+ and O2+ at photon energies for characteristic excitation by a simulation calculation. The dissociation pathways from the core-hole states of NO were discussed using the kinetic energy distribution and ion intensity ratios as well as Auger electron spectra in the literature.