Table 2: Typical microstructural and superconducting properties of double-sided 3-inch diameter PLD-YBCO films on sapphire with CeO2 buffer layer [10]. Microwave measurements were done in Wuppertal [63] and Karlsruhe [70, 71].

PropertyTypical value

YBCO-thickness 𝑑 Y B C O .( 2 3 0 ± 3 0 ) nm
C-axis lattice constant c.( 1 1 . 6 5 9 ± 0 . 0 0 6 ) Å
A-axis lattice constant a.( 3 . 8 2 9 ± 0 . 0 0 3 ) Å
Orthorhombic splitting
(b-a)/a.
( 1 . 5 2 ± 0 . 0 5 )%
Percentage of a-axis
oriented grains.
0 to 0.5%
In-plane epitaxially oriented film
area to total illuminated area in
Raman spectroscopy.
75 to 94 %
Critical temperature 𝑇 c .87.5 to 90 K
Critical current density 𝑗 c
at 77 K and 𝐵 = 0 .
3.5 to 5.5 MA/cm2
Surface resistance 𝑅 s
at 10 GHz and 77 K.
500 to 600 μΩ
Microwave surface magnetic
field 𝐵 s at 8.5 GHz and 77 K for 𝑅 s + 20% [63].
8 to 10 mT
Surface resistance 𝑅 s at 145 GHz and 77 K [70].40 to 60 mΩ