Evaluation of the Thickness in Nanolayers Using the Transfer Matrix 
                        Method for Modeling the Spectral Reflectivity

<table>The ZnTe/GaAs
reflectance spectra calculated by the TM method and by “SCOUT 98” commercial program, for two
different thicknesses: (a) thin film, <i>t =</i> 500 nm, and (b) very thin film, <i>t =</i> 50 nm.</table>

Physics Research International

fig1

Figure 1

Figure 1: Evaluation of the Thickness in Nanolayers Using the Transfer Matrix 
                        Method for Modeling the Spectral Reflectivity 

Figure 1 | Evaluation of the Thickness in Nanolayers Using the Transfer Matrix 
                        Method for Modeling the Spectral Reflectivity 

Physics Research International

Evaluation of the Thickness in Nanolayers Using the Transfer Matrix Method for Modeling the Spectral Reflectivity

Figure 1