Physics Research International / 2009 / Article / Fig 1

Research Letter

Evaluation of the Thickness in Nanolayers Using the Transfer Matrix Method for Modeling the Spectral Reflectivity

Figure 1

The ZnTe/GaAs reflectance spectra calculated by the TM method and by “SCOUT 98” commercial program, for two different thicknesses: (a) thin film, t = 500 nm, and (b) very thin film, t = 50 nm.
594175.fig.001a
(a)
594175.fig.001b
(b)

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