Physics Research International / 2009 / Article / Fig 2

Research Letter

Evaluation of the Thickness in Nanolayers Using the Transfer Matrix Method for Modeling the Spectral Reflectivity

Figure 2

The experimental and computed reflectance spectra for the best fit: (a) t = (22 ± 4) nm, and (b) t = (59 ± 5) nm. The uncertainty values were calculated by the minimum squares method.
(a) t = (22 ± 4) nm
(b) t = (59 ± 5) nm

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