Table of Contents
Physics Research International
Volume 2012, Article ID 323279, 8 pages
Research Article

Correlation between the Magnetoresistance, IR Magnetoreflectance, and Spin-Dependent Characteristics of Multilayer Magnetic Films

Institute for Information Recording, National Academy of Sciences of Ukraine, 2 Shpak Street, Kiev 03113, Ukraine

Received 27 July 2011; Accepted 25 October 2011

Academic Editor: Manh-Huong Phan

Copyright © 2012 V. G. Kravets. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


We present the experimental results on magnetorefractive effect (MRE) in ferromagnetic metal-metal and metal-insulator multilayer films of different composition and different type of magnetoresistive effects. The shape and magnitude of the MRE dependences are found to be very sensitive to the spin-dependent scattering parameters and the effective polarization of the electron density of state around the Fermi level. A study of an MRE in multilayered films is shown to be sufficient for direct extracting of the spin-dependent relaxation times of electron (for GMR-like samples) and energy dependence of the tunnel spin-polarization density of states near the Fermi level for layered TMR films. It is proposed to use the magnetorefractive effect as a noncontact probe of magnetoresistive effects in thin magnetic films through investigations of the field-dependent reflection behaviors of multilayered films in the IR region.