Table of Contents
Textures and Microstructures
Volume 14 (1991)–18
http://dx.doi.org/10.1155/TSM.14-18.623

High-Voltage Electron Microscopy of the Early Stages of Recrystallization in CuMn

Institut für Metallphysik, Universität Göttingen, Hospitalstraße 3-7, Göttingen D-3400, Germany

Copyright © 1991 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

CuMn-specimens were observed by HVEM to obtain information about the recrystallization process influenced by foreign atoms. Up to a concentration of 10 at.% Mn the SFE of this system does not change. Along the grain boundaries the orientations of the recrystallized grains and of the deformation microstructure were determined to establish the local orientation relationships. The grain orientations can be described by twinning of the deformation microstructure. Only 20-30°<111> and 40-50°<221> orientation relationships were found. Known from growth selection experiments these orientation relationships are already the final ones of the recrystallization texture. Because of the SFE and the large misfit between Cu and Mn these orientation relationships were formed rapidly after nucleation. Thus, the orientation formation process is finished after several μm of growth.