Texture, Stress, and Microstructure

PDF
Texture, Stress, and Microstructure / 1991 / Article

On this page

AbstractCopyright
Special Issue

Ninth International Conference on Textures of Materials

View this Special Issue

Open Access

Volume 14 |Article ID 268145 | 4 pages | https://doi.org/10.1155/TSM.14-18.241

Scanning X-Ray Apparatus for Texture Mapping by Energy Dispersive Diffraction

R. A. Schwarzer1

1Institut für Metallkunde und Metallphysik der TUC, Grosser Bruch 23, Clausthal-Z. D-3392, Germany

Abstract

This article has no abstract.

Copyright © 1991 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

More related articles

11 Views | 0 Downloads | 2 Citations
PDF Download Citation Citation
Order printed copiesOrder

Related articles

We are committed to sharing findings related to COVID-19 as quickly and safely as possible. Any author submitting a COVID-19 paper should notify us at help@hindawi.com to ensure their research is fast-tracked and made available on a preprint server as soon as possible. We will be providing unlimited waivers of publication charges for accepted articles related to COVID-19. Sign up here as a reviewer to help fast-track new submissions.