Abstract

Textures have been measured by means of X-ray pole figures for high temperature superconductor materials in both bulk and thin film form. Variations in the epitaxy of the yttrium-based thin films are correlated with processing history and properties. Textures are given for deformation-processed Bi-based material, which, when subsequently melt-proCessed, exhibits high critical currents. The surface resistance of Tl-based films on a silver substrate are correlated with the sharpness of the texture.