Texture-Property Relationships in the High Temperature
Superconductors
A. D. Rollett,1H.-R. Wenk,2F. Heidelbach,1T. G. Schofield,1R. E. Muenschausen,1I. D. Raistrick,1P. N. Arendt,1D. A. Korzekwa,1K. Bennett,1and J. S. Kallend3
Abstract
Textures have been measured by means of X-ray pole figures for high temperature
superconductor materials in both bulk and thin film form. Variations in the epitaxy of the
yttrium-based thin films are correlated with processing history and properties. Textures are
given for deformation-processed Bi-based material, which, when subsequently melt-proCessed,
exhibits high critical currents. The surface resistance of Tl-based films on a silver substrate
are correlated with the sharpness of the texture.