Table of Contents
Textures and Microstructures
Volume 14–18
http://dx.doi.org/10.1155/TSM.14-18.781

Development of an X-Ray Technique for Measuring Grain Size as a Function of Orientation in Polycrystalline Materials

Centro Sviluppo Materiali, C.P. 10747 Roma-Eur, Italy

Copyright © 1991 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

A new application of the X-ray technique developed by B.E. Warren [1], is presented here. The method, based on statistical fluctuation of counts recorded by a properly modified X-ray diffractometer, has been used to estimate the average grain diameter of different textural classes in metallic polycrystalline materials; it has been tested to evaluate its reproducibility and precision limits. The method appears to be promising for current applications in industrial research laboratories and for quality control routines since specimen preparation is easy and measurement is automated.