Table of Contents
Textures and Microstructures
Volume 14 (1991)–18
http://dx.doi.org/10.1155/TSM.14-18.181

Low Incidence X-Ray Goniometry for Thin Films Texture Analysis

Laboratoire de Métallurgie Physique et Chimique, METZ University, 57045, France

Copyright © 1991 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

J. J. Heizmann, D. Schlatter, A. Vadon, C. Baltzinger, and J. Bessieres, “Low Incidence X-Ray Goniometry for Thin Films Texture Analysis,” Textures and Microstructures, vol. 14, pp. 181-186, 1991. doi:10.1155/TSM.14-18.181