Local Texture Measurements by EBSP. New Computer Procedures

Jensen, D. Juul; Schmidt, N. H.

doi:https://doi.org/10.1155/TSM.14-18.97

Texture, Stress, and Microstructure

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Ninth International Conference on Textures of Materials

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Volume 14 | Article ID 605603 | https://doi.org/10.1155/TSM.14-18.97

Local Texture Measurements by EBSP. New Computer Procedures

D. Juul Jensen¹and N. H. Schmidt¹

Abstract

Two new computer procedures for analysis of electron back scattering patterns (EBSP) are presented. One is a semiautomatic procedure for on-line analysis of EBSPs. The other is an image processing procedure for computer identification of bands in an EBSP. These two procedures may be combined for fully automatic indexing of EBSPs.

Copyright

Copyright © 1991 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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