Special IssueNinth International Conference on Textures of Materials
View this Special Issue Open AccessComparative Study Between Low Incidence X-Ray Diffraction and
Electron Diffraction Applied to Texture Determination of Thin
Films of Cu/NaCl
D. Schlatter,1C. Baltzinger,1A. Tizliouine,1J. J. Heizmann,1and C. Burggraf2
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