Table of Contents
Textures and Microstructures
Volume 14–18
http://dx.doi.org/10.1155/TSM.14-18.127

Comparative Study Between Low Incidence X-Ray Diffraction and Electron Diffraction Applied to Texture Determination of Thin Films of Cu/NaCl

1Laboratoire de Metallurgie Physique & Chimique, METZ University, France
2I.C.P.M.S.- U.M. 380046- C.N.R.S -U.L.P- E.H.I.C.S. et I. U.T.- U.L.P. 67000, Strasbourg, France

Copyright © 1991 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

D. Schlatter, C. Baltzinger, A. Tizliouine, J. J. Heizmann, and C. Burggraf, “Comparative Study Between Low Incidence X-Ray Diffraction and Electron Diffraction Applied to Texture Determination of Thin Films of Cu/NaCl,” Textures and Microstructures, vol. 14, pp. 127-132, 1991. https://doi.org/10.1155/TSM.14-18.127.