Table of Contents
Textures and Microstructures
Volume 14 (1991)–18
http://dx.doi.org/10.1155/TSM.14-18.597

Characterization of Recrystallization Textures in Fe-3% Si Sheets by EBSP: Comparison With X Ray Diffraction

Laboratoire de Métallurgie Structurale, Bâtiment 413, URA CNRS 1107, Université Paris Sud, Orsay, 91405, France

Copyright © 1991 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

R. Penelle, T. Baudin, P. Paillard, and L. Mora, “Characterization of Recrystallization Textures in Fe-3% Si Sheets by EBSP: Comparison With X Ray Diffraction,” Textures and Microstructures, vol. 14, pp. 597-610, 1991. doi:10.1155/TSM.14-18.597