Table of Contents
Textures and Microstructures
Volume 19 (1992), Issue 4, Pages 189-196
http://dx.doi.org/10.1155/TSM.19.189

X-Ray Diffraction Method for Determination of Texture Evolution in Layers

Institute of Physical Chemistry, Bulgarian Academy of Sciences, Sofia 1040, Bulgaria

Received 1 October 1991

Copyright © 1992 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

An X-ray diffraction method for the determination of texture evolution in electrodeposited and vapour-deposited layers was developed. It was applied to the study of the texture of electrodeposited bright zinc. It was established that the arising of texture in the concrete models is due to oriented nucleation as well as to a growth selection process. The substrate structure also has an effect on the character of the texture evolution.