Y. Yoshitomi, K. Ohta, J. Harase, Y. Suga, "A Method for Measuring Strain by Analyzing Sharpness of ECP With Image Analysis", Texture, Stress, and Microstructure, vol. 22, Article ID 251085, 20 pages, 1994. https://doi.org/10.1155/TSM.22.199
A Method for Measuring Strain by Analyzing Sharpness of ECP With Image Analysis
A method for measuring strain by analyzing sharpness of Electron Channeling Pattern (ECP) with Image analysis has been newly developed. The relative value of sharpness of first-order pseudo-Kikuchi line in ECP is used as a parameter of strain. Strain change of Fe-3.25%Si alloy single crystal and polycrystal during deformation and recrystallization was analyzed by this method. This method was compared with the conventional methods; hardness and line broadening of X-ray. This method can be used for measuring strain in material with any crystal orientation.
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