A method for measuring strain by analyzing sharpness of Electron Channeling Pattern (ECP) with Image analysis has been newly developed. The relative value of sharpness of first-order pseudo-Kikuchi line in ECP is used as a parameter of strain. Strain change of Fe-3.25%Si alloy single crystal and polycrystal during deformation and recrystallization was analyzed by this method. This method was compared with the conventional methods; hardness and line broadening of X-ray. This method can be used for measuring strain in material with any crystal orientation.