Table of Contents
Textures and Microstructures
Volume 22, Issue 4, Pages 199-218
http://dx.doi.org/10.1155/TSM.22.199

A Method for Measuring Strain by Analyzing Sharpness of ECP With Image Analysis

1Electrical Steel Laboratory, R&D Laboratories III, Nippon Steel Corporation, Edamitu, Yawata-Higashi-ku, Kitakyushu 805, Japan
2Semiconductor Materials Research Laboratory, Electronics R and D Laboratories, Nippon Steel Corporation, Hikari 743, Shimada, Japan

Received 20 September 1990; Accepted 10 December 1993

Copyright © 1994 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

A method for measuring strain by analyzing sharpness of Electron Channeling Pattern (ECP) with Image analysis has been newly developed. The relative value of sharpness of first-order pseudo-Kikuchi line in ECP is used as a parameter of strain. Strain change of Fe-3.25%Si alloy single crystal and polycrystal during deformation and recrystallization was analyzed by this method. This method was compared with the conventional methods; hardness and line broadening of X-ray. This method can be used for measuring strain in material with any crystal orientation.