Table of Contents
Textures and Microstructures
Volume 26 (1996)–27
http://dx.doi.org/10.1155/TSM.26-27.59

Secondary Extinction Correction Used in Pole Density Measurements by X-Ray Diffraction

1Institute of Physical Chemistry, Bulgarian Academy of Sciences, Sofia 1113, Bulgaria
2Central Laboratory of Solar Energy and New Energy Sources, Sofia 1184, Bulgaria

Received 10 November 1995

Copyright © 1996 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

A new X-ray diffraction method for a more accurate determination of film pole densities is developed by introducing a secondary extinction correction. To this end an equation based on the kinematic theory of X-ray diffraction and the mosaic crystal model is derived. Pole densities were computed either by using the two order reflections techniques or by the least-square method. The discussion of results shows that the correct study of film structure by X-ray diffraction requires in general the secondary extinction to be taken into account.