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Proceedings of the Workshop Mathematical Methods of Texture Analysis
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On the Use of Polycrystal and Individual Orientation Texture Analysis Methods for BCC Materials
Abstract
The reliability of the harmonic method of the ODF calculation from X-ray pole figures was estimated for cubic symmetry materials. For this purpose simulated textures with a preset scattering value of the components were used. Some examples using the Roe method to the study of the secondary recrystallization process in the Fe-3% Si alloy are given. The capabilities of the etch-pits methods as the simplest discrete method used to determine the orientation density are discussed.
Copyright
Copyright © 1996 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
