Table of Contents
Textures and Microstructures
Volume 29, Issue 1-2, Pages 53-64
http://dx.doi.org/10.1155/TSM.29.53

X-Ray Stress Analysis by Use of an Area Detector

Fraunhofer-Einrichtung für Zuverlässigkeit und Mikrointegration (IZM), Gustav-Meyer-Allee 25, Berlin D-13355, Germany

Received 14 February 1995

Copyright © 1997 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

The most commonly known techniques of X-ray residual stress analysis use diffractometers with conventional counters or position sensitive detectors. The sin2Ψ-method is often applied to X-ray stress determination, but requires various measurements at different sample positions. This technique was combined with an imaging plate, which is an X-ray digital area detector. The use of a two-dimensional detector like an imaging plate offers the possibility to get diffraction in one measurement from lattice planes lying on the whole diffraction cone. Thus the number of measurements for the calculation of the stress components can be significantly reduced. In addition, the use of an imaging plate has several advantages for the stress calculation even for materials having relatively large grains or a strong texture. Measurements on an electron beam hardened steel sample are described as an application example.