Table of Contents
Textures and Microstructures
Volume 35 (2001), Issue 1, Pages 39-54
http://dx.doi.org/10.1155/TSM.35.39

Quantification of Minor Texture Components by Hard X-Rays

1Materials Research Department, Riso Nat. Lab., Roskilde DK-4000, Denmark
2HASYLAB at DESY, Notkestrasse 85, Hamburg D-22607, Germany
3European Synchrotron Radiation Facility, BP 220, Grenoble F-38043 , France

Received 3 May 2001; Accepted 25 May 2001

Copyright © 2001 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

H. F. Poulsen, D. Juul Jensen, T. Tschentscher, et al., “Quantification of Minor Texture Components by Hard X-Rays,” Textures and Microstructures, vol. 35, no. 1, pp. 39-54, 2001. doi:10.1155/TSM.35.39