H. J. Bunge, H. Klein, L. Wcislak, U. Garbe, W. Weiß, J. R. Schneider, "High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method", Texture, Stress, and Microstructure, vol. 35, Article ID 194861, 19 pages, 2003. https://doi.org/10.1080/07303300310001642638
High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method
In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation must be known in all points of the material. This can be achieved by locationresolved diffraction of high-energy, i.e. short-wave, X-rays from synchrotron sources. Highest resolution in the orientation- as well as the location-coordinates can be achieved by three variants of a detector “sweeping” technique in which an area detector is continuously moved during exposure. This technique results in two-dimensionally continuous images which are sections and projections of the six-dimensional “orientation– location” space. Further evaluation of these images depends on whether individual grains are resolved in them or not. Because of the high penetration depth of high-energy synchrotron radiation in matter, this technique is also, and particularly, suitable for the investigation of the interior of big samples.
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