Table of Contents
Textures and Microstructures
Volume 35, Issue 3-4, Pages 253-271

High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method

1Department of Physics and Physical Technologies, Technical University of Clausthal, Leibnizstr. 4, Clausthal-Zellerfeld D-38678, Germany
2Department of Crystallography, University of Göttingen, Goldschmidtstr. 1, Göttingen D-37077, Germany
3HASYLAB at Deutsches Elektronen Synchrotron DESY, Notkestr. 85, Hamburg D-22603, Germany
4Gerstenkamp 9, Köln D-51061, Germany

Received 13 September 2003

Copyright © 2003 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation g={ϕ1Φϕ2} must be known in all points x={x1x2x3} of the material. This can be achieved by locationresolved diffraction of high-energy, i.e. short-wave, X-rays from synchrotron sources. Highest resolution in the orientation- as well as the location-coordinates can be achieved by three variants of a detector “sweeping” technique in which an area detector is continuously moved during exposure. This technique results in two-dimensionally continuous images which are sections and projections of the six-dimensional “orientation– location” space. Further evaluation of these images depends on whether individual grains are resolved in them or not. Because of the high penetration depth of high-energy synchrotron radiation in matter, this technique is also, and particularly, suitable for the investigation of the interior of big samples.