Textures and Microstructures
Volume 35 (2003), Issue 3-4, Pages 253-271
http://dx.doi.org/10.1080/07303300310001642638
High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method
1Department of Physics and Physical Technologies, Technical University of Clausthal, Leibnizstr. 4, Clausthal-Zellerfeld D-38678, Germany
2Department of Crystallography, University of Göttingen, Goldschmidtstr. 1, Göttingen D-37077, Germany
3HASYLAB at Deutsches Elektronen Synchrotron DESY, Notkestr. 85, Hamburg D-22603, Germany
4Gerstenkamp 9, Köln D-51061, Germany
Received 13 September 2003
Copyright © 2003 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
How to Cite this Article
H. J. Bunge, H. Klein, L. Wcislak, U. Garbe, W. Weiß, and J. R. Schneider, “High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method,” Textures and Microstructures, vol. 35, no. 3-4, pp. 253-271, 2003. doi:10.1080/07303300310001642638