Table of Contents
Textures and Microstructures
Volume 35 (2003), Issue 3-4, Pages 283-290
http://dx.doi.org/10.1080/07303300310001597035

Intensity Correction in Texture Measurement of Polycrystalline Thin Films by X-Ray Diffraction

1School of Materials Science and Engineering, Jiao Tong University, Shanghai 200030, China
2Department of Metallurgy and Materials Engineering, Katholieke Universiteit Leuven, Leuven B-3001, Belgium

Received 28 May 2003; Revised 5 June 2003

Copyright © 2003 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Y. S. Liu, L. Depre, L. De Buyser, T. B. Wu, and P. Van Houtte, “Intensity Correction in Texture Measurement of Polycrystalline Thin Films by X-Ray Diffraction,” Textures and Microstructures, vol. 35, no. 3-4, pp. 283-290, 2003. doi:10.1080/07303300310001597035