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VLSI Design
Volume 6 (1998), Issue 1-4, Pages 303-306
http://dx.doi.org/10.1155/1998/34726

Statistical Enhancement of Terminal Current Estimation for Monte Carlo Device Simulation

1Swiss Federal Institute of Technology, Integrated Systems Laboratory, Gloriastrasse 35, Zürich CH-8092, Switzerland
2Fujitsu Laboratories, Ltd., ULSI Research Division, Atsugi 243-01, Japan

Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

P. D. Yoder, U. Krumbein, K. Gärtner, N. Sasaki, and W. Fichtner, “Statistical Enhancement of Terminal Current Estimation for Monte Carlo Device Simulation,” VLSI Design, vol. 6, no. 1-4, pp. 303-306, 1998. doi:10.1155/1998/34726