VLSI Design

VLSI Design / 1998 / Article

Open Access

Volume 7 |Article ID 045472 | https://doi.org/10.1155/1998/45472

Sunil R. Das, Nita Goel, Wen B. Jone, Amiya R. Nayak, "Syndrome Signature in Output Compaction for VLSI Built-in Self-Test", VLSI Design, vol. 7, Article ID 045472, 11 pages, 1998. https://doi.org/10.1155/1998/45472

Syndrome Signature in Output Compaction for VLSI Built-in Self-Test

Received10 Jun 1997

Abstract

In this paper, we focus on the use of signature-based output compaction technique for built-in self-testing of VLSI circuits. We give algorithm for single-output and multiple-output signature generation using exhaustive test patterns extending the syndrome conccpt. The signature wc develop is a functional signature and is very effective for both input and internal line fault detection, as seen from simulation on various benchmark circuits. The signature generators can bc easily implemented using the current VLSI technology.

Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


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