Integrated On-Line and Off-Line Error Detection Mechanisms in the Coding Theory Framework

Abstract

In this paper we present an approach for combining on-line concurrent checking (CC) with off-line built-in self-test (BIST). We will show that a reduction of an aliasing probability can be obtained for manufacturing testing by monitoring the output of a concurrent checker and a reduction of a probability of not detecting an error in the computing mode can be obtained by a short periodic BIST. We will present a technique for optimal selection of error-detecting codes for combined on-line CC and off-line space-time compression of test responses for BIST and estimate probabilities of not detecting an error for the approach based on integrating CC and BIST. We also present a technique for on-line error-detection in space-time compressors of test responses for BIST.